Testing Highly Integrated Wireless Circuits and Systems with Low Cost Tester: How to Overcome the Challenge?
نویسنده
چکیده
Today’s wireless communication products become more complex and more integrated. The low cost prices paid by the consumer for wireless phones and the competitive market imposed a tremendous pressure to have low cost RF ICs. The test cost becomes almost the main factor determining profit margin. To economically test high volumes of integrated RF ICs at a fraction of the cost of the IC we have to define a complete new test strategy. Buying new ATEs or upgrading testers for each category of application is an expensive operation and increases test cost.
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